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Chemical Analysis

GD-OES

Glow Discharge Optical Emission Spectroscopy (GD-OES) is a powerful tool for bulk composition analysis as well as the surface analysis of metals and many other types of materials.  Compared with ICP-OES, GD-OES enables analysis directly on the sample surface, therefore is less destructive and produces more reliable results by avoiding the sample digestion and dilution process.    Due to its nature of sampling by continuous sputtering, GD-OES can be used to provide the layer-by-layer chemical information, which makes it an ideal method for depth profiling of multi-layered samples.   EMSL provides GD-OES analysis services for both bulk material and surface layers using the state-of-the-art pulsed RF GD-Profiler HRTM system manufactured by Horiba Scientific.  

Examples of materials that can be analyzed using GD-OES:

  • Steels, aluminum alloys, Ni alloys and other metallic alloys.

  • Plating layer and surface coatings on metallic products.

  • Ceramic, glass and polymers.

  • Semiconducting materials.  

 

ICP-OES and ICP-MS

Inductively-coupled plasma optical emission spectrometry (ICP-OES) and mass spectrometry (ICP-MS) are important techniques for chemical analysis of metals and other materials, especially for trace element analysis.   EMSL routinely performs analysis of metals using ICP-OES and ICP-MS, in addition to chemical analysis of metals by other techniques such as XRF, EDS, flame atomic absorption spectrometry and graphic furnace atomic absorption spectrometry.    . 

 

XRF

X-ray fluorescence spectrometry (XRF) is a chemical analysis technique for obtaining elemental composition of materials. Among XRF instruments, wavelength-dispersive XRF (WDXRF) offers the highest sensitivity (with lowest detection limit in sub-ppm level for most elements) and best resolution and accuracy. 

Using highly sophisticated WDXRF systems, we provide chemical analysis services on a wide variety of materials. Followings are some examples of XRF analysis offered at EMSL:

  • Analysis of low alloy steels by ASTM E1085

  • Analysis of stainless alloys by ASTM E572

  • Analysis of cast iron by ASTM E322  

 

EDS (EDX)

Energy-dispersive X-ray spectroscopy (EDS or EDX), when coupled with scanning or transmission electron microscopy, provides local elemental composition information in the microstructure of a sample.  Such information is essential for material characterization such as identification of the alloys or failure analysis.  EMSL is equipped with latest-technology EDS microanalysis systems and offers EDS analyses such as elemental composition, line scan, and elemental mapping to our clients.    

 

LECO Combustion Analysis

The LECO Combustion Analyzers at EMSL are used to determine carbon and sulfur contents in metals and inorganic materials, and carbon, hydrogen and nitrogen contents in organic matrices, following industry standard methods such as ASTM E1019.  

ICP-OES
XRF
EDS
LECO

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